TESCAN Scanning Electron Microscope (FEG) coupled to a RAMAN spectrometer

High resolution SEM (FEG),

Secondary electron detectors, secondary electron detectors for high resolution (In-Beam) and for controlled pressure (LVSTD);

Combined detector for backscattered electrons (scintillator) / cathodoluminescence (350 – 650 nm);

STEM Dark Field / Bright Field detector;

Peltier stage (+10 / -50 °C)

EDS / EBSD microanalysis system:

Nitrogen-free EDS detector (SDD);

Qualitative, quantitative analysis;

Elemental and phase mapping;

Automatic particle analysis;

High resolution EBSD camera;

Coupled EDS / EBSD analysis

Raman spectrometer and SEM-Raman coupling

3 lasers : 514, 632 and 785 nm ;

Objectives x5 to x100 and 50 LW;

Raman mapping and fast imaging Streamline;

Peltier stage -196 / + 600°C;

SEM-Raman coupling interface for Raman acquisition in the SEM